Invention Grant
- Patent Title: Multiple nozzle gas cluster ion beam system
- Patent Title (中): 多喷嘴气体簇离子束系统
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Application No.: US12428945Application Date: 2009-04-23
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Publication No.: US08981322B2Publication Date: 2015-03-17
- Inventor: Martin D. Tabat , Matthew C. Gwinn , Robert K. Becker , Avrum Freytsis , Michael Graf
- Applicant: Martin D. Tabat , Matthew C. Gwinn , Robert K. Becker , Avrum Freytsis , Michael Graf
- Applicant Address: US MA Billerica
- Assignee: TEL Epion Inc.
- Current Assignee: TEL Epion Inc.
- Current Assignee Address: US MA Billerica
- Agency: Wood, Herron & Evans, LLP
- Main IPC: G21K5/04
- IPC: G21K5/04 ; H01J37/08 ; H01J37/317

Abstract:
Disclosed is a multi-nozzle and skimmer assembly for introducing a process gas mixture, or multiple process gases mixtures, in a gas cluster ion beam (GCIB) system, and associated methods of operation to grow, modify, deposit, or dope a layer upon a substrate. The multiple nozzle and skimmer assembly includes at least two nozzles arranged in mutual close proximity to at least partially coalesce the gas cluster beams emitted therefrom into a single gas cluster beam and/or angled to converge each beam toward a single intersecting point to form a set of intersecting gas cluster beams, and to direct the single and/or intersecting gas cluster beam into a gas skimmer.
Public/Granted literature
- US20100193701A1 MULTIPLE NOZZLE GAS CLUSTER ION BEAM SYSTEM Public/Granted day:2010-08-05
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