Invention Grant
- Patent Title: Smart optical material characterization system and method
- Patent Title (中): 智能光学材料表征系统及方法
-
Application No.: US12964381Application Date: 2010-12-09
-
Publication No.: US08982355B2Publication Date: 2015-03-17
- Inventor: Sang Hyouk Choi , Yeonjoon Park
- Applicant: Sang Hyouk Choi , Yeonjoon Park
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
- Current Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
- Current Assignee Address: US DC Washington
- Agent Jennifer L. Riley; Thomas K. McBride
- Main IPC: G01J3/45
- IPC: G01J3/45 ; G01B9/02 ; G01B11/02 ; G01N21/41 ; G01J9/02 ; G01N21/21 ; G01N21/45

Abstract:
Disclosed is a system and method for characterizing optical materials, using steps and equipment for generating a coherent laser light, filtering the light to remove high order spatial components, collecting the filtered light and forming a parallel light beam, splitting the parallel beam into a first direction and a second direction wherein the parallel beam travelling in the second direction travels toward the material sample so that the parallel beam passes through the sample, applying various physical quantities to the sample, reflecting the beam travelling in the first direction to produce a first reflected beam, reflecting the beam that passes through the sample to produce a second reflected beam that travels back through the sample, combining the second reflected beam after it travels back though the sample with the first reflected beam, sensing the light beam produced by combining the first and second reflected beams, and processing the sensed beam to determine sample characteristics and properties.
Public/Granted literature
- US20120147379A1 Smart Optical Material Characterization System and Method Public/Granted day:2012-06-14
Information query