Invention Grant
- Patent Title: Method of component concentration detection based on reference wavelength
- Patent Title (中): 基于参考波长的元件浓度检测方法
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Application No.: US12996089Application Date: 2009-06-03
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Publication No.: US08996338B2Publication Date: 2015-03-31
- Inventor: Kexin Xu , Wenliang Chen
- Applicant: Kexin Xu , Wenliang Chen
- Applicant Address: CN Tianjin
- Assignee: Tianjin Sunrise Technologies Development Co., Ltd.
- Current Assignee: Tianjin Sunrise Technologies Development Co., Ltd.
- Current Assignee Address: CN Tianjin
- Agency: Merchant & Gould P.C.
- Priority: CN200810053456 20080606
- International Application: PCT/CN2009/072113 WO 20090603
- International Announcement: WO2009/146651 WO 20091210
- Main IPC: G06F17/10
- IPC: G06F17/10 ; G01N15/02 ; G01N21/359 ; A61B5/145

Abstract:
A method of detecting a concentration of a target component by using a reference wavelength includes: defining a wavelength at which a light intensity is insensitive to the variation of the target component concentration as a reference wavelength for the target component; detecting spectra at both the reference wavelength and a further measuring wavelength; processing the spectrum detected at the further measuring wavelength, with the spectrum detected at the reference wavelength as an inner reference, to obtain a characteristic spectrum including specific information of the target component; building a calibration model between the characteristic spectrum and the concentration of the target component; and determining the concentration of the target component based on the calibration model.
Public/Granted literature
- US20110131021A1 METHOD OF COMPONENT CONCENTRATION DETECTION BASED ON REFERENCE WAVELENGTH Public/Granted day:2011-06-02
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