Invention Grant
- Patent Title: Calibration light source
- Patent Title (中): 校准光源
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Application No.: US13322396Application Date: 2010-05-18
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Publication No.: US08998453B2Publication Date: 2015-04-07
- Inventor: Thomas Näegele , Detlef Hannak , Simon Sturm
- Applicant: Thomas Näegele , Detlef Hannak , Simon Sturm
- Applicant Address: DE Munich
- Assignee: Instrument Systems Optische Meβtechnik GmbH
- Current Assignee: Instrument Systems Optische Meβtechnik GmbH
- Current Assignee Address: DE Munich
- Agency: SoCal IP Law Group LLP
- Agent Mark A. Goldstein
- Priority: DE102009022611 20090526
- International Application: PCT/EP2010/003033 WO 20100518
- International Announcement: WO2010/136140 WO 20101202
- Main IPC: F21V29/00
- IPC: F21V29/00 ; G01J3/10 ; G01J1/08 ; G01J5/52 ; H05B33/08 ; G01J1/02 ; G01J3/02

Abstract:
The invention relates to a calibration radiation source comprising the following: a housing (2) having an opening (12), a board (22) held in the housing (2), a semiconductor radiation source (18) mounted on the board (22) for generating a light beam, and an exit opening support element (14) having, in the area of the opening (12), a light exit opening (15) through which the light beam radiates outwards from the housing (2). The exit opening support element (14) is decoupled from the housing (2), and is attached to the board (22) of the semiconductor radiation source (18).
Public/Granted literature
- US20120140472A1 Calibration Light Source Public/Granted day:2012-06-07
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