Calibration light source
    2.
    发明授权
    Calibration light source 有权
    校准光源

    公开(公告)号:US08998453B2

    公开(公告)日:2015-04-07

    申请号:US13322396

    申请日:2010-05-18

    Abstract: The invention relates to a calibration radiation source comprising the following: a housing (2) having an opening (12), a board (22) held in the housing (2), a semiconductor radiation source (18) mounted on the board (22) for generating a light beam, and an exit opening support element (14) having, in the area of the opening (12), a light exit opening (15) through which the light beam radiates outwards from the housing (2). The exit opening support element (14) is decoupled from the housing (2), and is attached to the board (22) of the semiconductor radiation source (18).

    Abstract translation: 本发明涉及一种包括以下的校准辐射源:具有开口(12),保持在壳体(2)中的板(22))的壳体(2),安装在板(22)上的半导体辐射源 )和在所述开口(12)的区域中具有光出射开口(15)的出射开口支撑元件(14),所述光束通过所述光出射开口(15)从所述壳体(2)向外辐射。 出口开口支撑元件(14)与壳体(2)分离,并且附接到半导体辐射源(18)的板(22)。

    Calibration Light Source
    3.
    发明申请
    Calibration Light Source 有权
    校准光源

    公开(公告)号:US20120140472A1

    公开(公告)日:2012-06-07

    申请号:US13322396

    申请日:2010-05-18

    Abstract: The invention relates to a calibration radiation source comprising the following: a housing (2) having an opening (12), a board (22) held in the housing (2), a semiconductor radiation source (18) mounted on the board (22) for generating a light beam, and an exit opening support element (14) having, in the area of the opening (12), a light exit opening (15) through which the light beam radiates outwards from the housing (2). The exit opening support element (14) is decoupled from the housing (2), and is attached to the board (22) of the semiconductor radiation source (18).

    Abstract translation: 本发明涉及一种包括以下的校准辐射源:具有开口(12),保持在壳体(2)中的板(22))的壳体(2),安装在板(22)上的半导体辐射源 )和在所述开口(12)的区域中具有光出射开口(15)的出射开口支撑元件(14),所述光束通过所述光出射开口(15)从所述壳体(2)向外辐射。 出口开口支撑元件(14)与壳体(2)分离,并且附接到半导体辐射源(18)的板(22)。

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