Invention Grant
- Patent Title: Microscope and observation method
- Patent Title (中): 显微镜和观察方法
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Application No.: US13578164Application Date: 2011-02-08
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Publication No.: US09001321B2Publication Date: 2015-04-07
- Inventor: Katsumasa Fujita , Shogo Kawano , Masahito Yamanaka , Satoshi Kawata
- Applicant: Katsumasa Fujita , Shogo Kawano , Masahito Yamanaka , Satoshi Kawata
- Applicant Address: JP Osaka
- Assignee: Osaka University
- Current Assignee: Osaka University
- Current Assignee Address: JP Osaka
- Agency: Maier & Maier, PLLC
- Priority: JP2010-027838 20100210
- International Application: PCT/JP2011/000697 WO 20110208
- International Announcement: WO2011/099269 WO 20110818
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G02B21/00 ; G01N21/65

Abstract:
Provided is a microscope and an observation method which can improve spatial resolution. A microscope according to an aspect of the invention includes a laser light source (10), an objective lens (16) that focuses light from the laser light source on a sample, and a detector (22) that detects the laser light as signal light from a sample (17) when the sample (17) is irradiated with the laser light. The light is applied to the sample with an intensity changed to obtain a nonlinear region where intensities of the light and the signal light have a nonlinear relation due to occurrence of saturation or nonlinear increase of the signal light when the light has a maximum intensity, and the detector (22) detects the signal light according to the intensity of the laser light to perform observation based on a saturation component or a nonlinear increase component of the signal light.
Public/Granted literature
- US20120307238A1 MICROSCOPE AND OBSERVATION METHOD Public/Granted day:2012-12-06
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