- Patent Title: Method and apparatus for observing subsurfaces of a target material
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Application No.: US13324400Application Date: 2011-12-13
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Publication No.: US09001326B2Publication Date: 2015-04-07
- Inventor: Ervin Goldfain
- Applicant: Ervin Goldfain
- Applicant Address: US NY Skaneateles Falls
- Assignee: Welch Allyn, Inc.
- Current Assignee: Welch Allyn, Inc.
- Current Assignee Address: US NY Skaneateles Falls
- Agency: Guntin & Gust, PLC
- Agent Ed Guntin
- Main IPC: G01J4/00
- IPC: G01J4/00 ; G01N21/00 ; G01N21/47 ; G01B11/24 ; A61B5/00 ; G01J3/02 ; G01N21/88 ; G01N21/49 ; G01N21/21

Abstract:
A system that incorporates teachings of the present disclosure may include, for example, a method for generating from a light source a light signal operating in a region of the light spectrum, modifying the light signal with a first polarization device having a first polarization state to generate a polarized light signal directed to a target, modifying a substantially specular reflection and a substantially diffused reflection of the polarized light signal generated from the target with a second polarization device having a second polarization state to generate mixed polarized light signals having a mixed polarization state, and adjusting the mixed polarization state to modify an observable range of subsurfaces of the target. Other embodiments are disclosed.
Public/Granted literature
- US20130148326A1 METHOD AND APPARATUS FOR OBSERVING SUBSURFACES OF A TARGET MATERIAL Public/Granted day:2013-06-13
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