Invention Grant
- Patent Title: Transmission X-ray analyzer
- Patent Title (中): 透射X射线分析仪
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Application No.: US13769704Application Date: 2013-02-18
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Publication No.: US09001966B2Publication Date: 2015-04-07
- Inventor: Yoshiki Matoba
- Applicant: Hitachi High-Tech Science Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Tech Science Corporation
- Current Assignee: Hitachi High-Tech Science Corporation
- Current Assignee Address: JP Tokyo
- Agency: Brinks Gilson & Lione
- Priority: JP2012-034792 20120221
- Main IPC: G01N23/083
- IPC: G01N23/083 ; H05G1/02 ; G21K5/10 ; G01N21/86 ; H01J37/20 ; G01N23/04

Abstract:
A transmission X-ray analyzer (1) for detecting a transmission X-ray image of a sample (100) that is continuous in a band shape includes: a TDI sensor (14); an X-ray source (12) arranged opposed to a TDI sensor; a pair of support rollers (31, 32) arranged away from the TDI sensor between the TDI sensor and the X-ray source, the pair of support rollers being configured to transport the sample to a detection position of the TDI sensor while keeping a constant interval between the TDI sensor and the sample; and a pair of outside rollers (51, 52) arranged respectively on an outer side of the pair of support rollers in a transportation direction (L). One of the pair of support rollers and one of the pair of outside rollers are arranged at different positions as to apply a tension to the sample between the pair of support rollers.
Public/Granted literature
- US20130216024A1 TRANSMISSION X-RAY ANALYZER Public/Granted day:2013-08-22
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