Invention Grant
- Patent Title: Optoelectronic measuring system with a compensation light source
- Patent Title (中): 具有补偿光源的光电测量系统
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Application No.: US13708041Application Date: 2012-12-07
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Publication No.: US09012827B2Publication Date: 2015-04-21
- Inventor: Bernd Mayer , Egbert Spiegel
- Applicant: Mechaless Systems GmbH
- Applicant Address: DE Bruchsal
- Assignee: Mechaless Systems GmbH
- Current Assignee: Mechaless Systems GmbH
- Current Assignee Address: DE Bruchsal
- Agency: Woodard, Emhardt, Moriarty, McNett & Henry LLP
- Priority: EP10168569 20100706
- Main IPC: G01J1/20
- IPC: G01J1/20 ; G01J1/44 ; G01S7/497 ; G01S17/02 ; G01S17/93

Abstract:
An optoelectronic measuring system comprises at least two transmission light sources that emit time-sequentially clocked, phased light. A compensation light source is controlled independently of the transmission light sources. A receiver receives the light radiated by the transmission light sources, and the compensation light source converts them into an electrical received signal. At least two evaluation units evaluate the received signal and generate one control signal each. At least two transmission paths each comprise a transmission light source, an evaluation unit and a clock generator. The clock generator generates the clock for the transmission light sources and for the evaluation unit. The evaluation units each generate a control signal. A control unit generates a compensation control signal from the control signals, with which the compensation light source is controlled and supplied. The evaluation unit generates a clock-synchronous control signal for the transmission light source from the received signal.
Public/Granted literature
- US20130092815A1 OPTOELECTRONIC MEASURING SYSTEM WITH A COMPENSATION LIGHT SOURCE Public/Granted day:2013-04-18
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