Invention Grant
- Patent Title: Calibration system for detector
- Patent Title (中): 检测器校准系统
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Application No.: US13590685Application Date: 2012-08-21
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Publication No.: US09024253B2Publication Date: 2015-05-05
- Inventor: Howard M. De Ruyter , James Steven Blackmon
- Applicant: Howard M. De Ruyter , James Steven Blackmon
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Agency: Lando & Anastasi, LLP
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G01J1/08 ; G01J5/04 ; G01J1/04 ; G01J5/52 ; G01J5/08

Abstract:
A calibration system and method for calibrating a detector are disclosed. In one example, the calibration system comprises a plurality of radiation sources configured to emit electromagnetic radiation, a positioning mechanism disposed opposite the plurality of radiation sources, having a single degree of freedom with respect to the plurality of radiation sources, and an optical element coupled to the positioning mechanism, and configured to rotate to a plurality of calibration positions, the optical element in each of the plurality of calibration positions being configured to receive the electromagnetic radiation from a corresponding radiation source and to reflect the electromagnetic radiation to the detector.
Public/Granted literature
- US20140054452A1 CALIBRATION SYSTEM FOR DETECTOR Public/Granted day:2014-02-27
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