Invention Grant
- Patent Title: Quantum-yield measurement device
- Patent Title (中): 量子产量测量装置
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Application No.: US13988778Application Date: 2011-08-31
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Publication No.: US09024278B2Publication Date: 2015-05-05
- Inventor: Kazuya Iguchi
- Applicant: Kazuya Iguchi
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: Hamamatsu Photonics K.K.
- Current Assignee: Hamamatsu Photonics K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2010-264853 20101129
- International Application: PCT/JP2011/069838 WO 20110831
- International Announcement: WO2012/073568 WO 20120607
- Main IPC: G01J1/58
- IPC: G01J1/58 ; G01N21/64

Abstract:
A quantum-yield measurement device 1A comprises a dark box 5; a light generation unit 6, having a light exit part 7, for generating the pumping light L1; a light detection unit 9, having a light entrance part 11, for detecting the light to be measured L2; an integrating sphere 14, having a light entrance opening 15 for the light L1 to enter and a light exit opening 16 for the light L2 to exit; and a movement mechanism 30 for moving a sample container 3, the part 7, and the part 11 such that the container 3 attains each of a first state of being located inside of the sphere 14 and a second state of being located outside of the sphere 14 and causing the part 7 and part 11 to oppose the opening 15 and opening 16, respectively, in the first state.
Public/Granted literature
- US20130240754A1 QUANTUM-YIELD MEASUREMENT DEVICE Public/Granted day:2013-09-19
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