Invention Grant
- Patent Title: User interface for an electron microscope
- Patent Title (中): 电子显微镜的用户界面
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Application No.: US12303717Application Date: 2007-06-07
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Publication No.: US09025018B2Publication Date: 2015-05-05
- Inventor: Martinus Petrus Maria Bierhoff , Bart Buijsse , Cornelis Sander Kooijman , Hugo Van Leeuwen , Hendrik Gezinus Tappel , Colin August Sanford , Sander Richard Marie Stoks , Steven Berger , Ben Jacobus Marie Bormans , Koen Arnoldus Wilhelmus Driessen , Johannes Antonius Hendricus W.G. Persoon
- Applicant: Martinus Petrus Maria Bierhoff , Bart Buijsse , Cornelis Sander Kooijman , Hugo Van Leeuwen , Hendrik Gezinus Tappel , Colin August Sanford , Sander Richard Marie Stoks , Steven Berger , Ben Jacobus Marie Bormans , Koen Arnoldus Wilhelmus Driessen , Johannes Antonius Hendricus W.G. Persoon
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Agency: Scheinberg & Associates, PC
- Agent Michael O. Scheinberg; Ki O
- International Application: PCT/US2007/070650 WO 20070607
- International Announcement: WO2007/143734 WO 20071213
- Main IPC: H04N5/253
- IPC: H04N5/253 ; H01J37/28 ; H01J37/16 ; H01J37/18 ; H01J37/20 ; H01J37/22 ; H01J37/244

Abstract:
A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.
Public/Granted literature
- US20100194874A1 User Interface for an Electron Microscope Public/Granted day:2010-08-05
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