Invention Grant
US09029774B2 Single photon detector in the near infrared using an InGaAs/InP avalanche photodiode operated with a bipolar rectangular gating signal
有权
使用双极矩形门控信号操作的InGaAs / InP雪崩光电二极管在近红外的单光子检测器
- Patent Title: Single photon detector in the near infrared using an InGaAs/InP avalanche photodiode operated with a bipolar rectangular gating signal
- Patent Title (中): 使用双极矩形门控信号操作的InGaAs / InP雪崩光电二极管在近红外的单光子检测器
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Application No.: US13881274Application Date: 2011-06-28
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Publication No.: US09029774B2Publication Date: 2015-05-12
- Inventor: Abdessattar Bouzid , Sung Wook Moon , Dong Hoon Yi , Se Min Kim
- Applicant: Abdessattar Bouzid , Sung Wook Moon , Dong Hoon Yi , Se Min Kim
- Applicant Address: KR Seoul
- Assignee: Korea Institute of Science and Technology
- Current Assignee: Korea Institute of Science and Technology
- Current Assignee Address: KR Seoul
- Agency: Ladas & Parry LLP
- International Application: PCT/KR2011/004696 WO 20110628
- International Announcement: WO2013/002430 WO 20130103
- Main IPC: G01J5/20
- IPC: G01J5/20 ; H01L31/09 ; G01J1/44

Abstract:
The present invention relates to a single photon detector (SPD) at telecom wavelength of 1.55 μm based on InGaAs/InP avalanche photodiode (APD). In order to operate the SPD at a low after-pulse noise, a DC bias voltage lower than the breakdown voltage is applied to an InGaAs/InP APD. A bipolar rectangular gating signal is superimposed with the DC bias voltage and applied to the APD so as to exceed the breakdown voltage during the gate-on time of each period of the gate signal. The use of the bipolar rectangular gating signal enabling us to operate the APD well below the breakdown voltage during the gate-off time, thereby make the release of the trapped charge carriers faster and then reduces the after-pulse noise. As a result, it permits to increase the repetition rate of the SPD.
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