Invention Grant
- Patent Title: X-ray beam system offering 1D and 2D beams
- Patent Title (中): 提供1D和2D光束的X射线束系统
-
Application No.: US13912364Application Date: 2013-06-07
-
Publication No.: US09031203B2Publication Date: 2015-05-12
- Inventor: Licai Jiang , Boris Verman
- Applicant: Rigaku Innovative Technologies, Inc.
- Applicant Address: US MI Auburn Hills
- Assignee: Rigaku Innovative Technologies, Inc.
- Current Assignee: Rigaku Innovative Technologies, Inc.
- Current Assignee Address: US MI Auburn Hills
- Agency: Brinks Gilson & Lione
- Main IPC: G21K1/06
- IPC: G21K1/06 ; G01N23/201
Abstract:
A system for analyzing a sample is provided. The system includes an optical system capable of providing a one-dimensional beam and a two-dimensional beam. The system may include a beam selection device to select between providing a one-dimensional x-ray beam to the sample in a one-dimensional operation mode and a two-dimensional x-ray beam to the sample in a two-dimensional operation mode.
Public/Granted literature
- US20130329861A1 X-RAY BEAM SYSTEM OFFERING 1D AND 2D BEAMS Public/Granted day:2013-12-12
Information query
