Invention Grant
- Patent Title: Self-diagnosis circuit
- Patent Title (中): 自诊断电路
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Application No.: US13870747Application Date: 2013-04-25
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Publication No.: US09049606B2Publication Date: 2015-06-02
- Inventor: Satoshi Mochizuki
- Applicant: YOKOGAWA ELECTRIC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2012-102591 20120427
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H04W24/00

Abstract:
A self-diagnosis circuit is coupled to a signal transmission path between a high-frequency signal input part and an output part and is configured to diagnose a high-frequency circuit using a signal that propagates along the signal transmission path. The self-diagnosis circuit includes a detector configured to detect the high-frequency signal propagating along the signal transmission path from the output part toward the input part; and a diagnosis unit that diagnoses for an abnormality in the follower stage of the high-frequency circuit disposed between a coupling part of the self-diagnosis circuit with respect to the signal transmission path and the output part, in accordance with the detection result of the detector.
Public/Granted literature
- US20130288609A1 SELF-DIAGNOSIS CIRCUIT Public/Granted day:2013-10-31
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