Invention Grant
US09093246B2 SACP method and particle optical system for performing the method
有权
SACP方法和粒子光学系统进行该方法
- Patent Title: SACP method and particle optical system for performing the method
- Patent Title (中): SACP方法和粒子光学系统进行该方法
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Application No.: US12942477Application Date: 2010-11-09
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Publication No.: US09093246B2Publication Date: 2015-07-28
- Inventor: Dirk Preikszas
- Applicant: Dirk Preikszas
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Fish & Richardson P.C.
- Priority: DE102009052392 20091109
- Main IPC: G01K1/08
- IPC: G01K1/08 ; H01J37/147 ; H01J37/295

Abstract:
An SACP method includes directing a beam of charged particles onto an object surface of an object using a particle optical system, and detecting intensities of particles emanating from the object. The method further includes: (a1) adjusting an excitation of the second beam deflector for adjusting an impingement location of the beam on the object surface; (a2) adjusting an excitation of the first beam deflector for adjusting an angle of incidence of the beam on the object surface without changing the impingement location and detecting the intensity; and (a3) repeating the adjusting of the excitation of the first beam deflector for adjusting the angle of incidence without changing the impingement location such that a corresponding intensity is detected for each of at least 100 different angles of incidence at the same impingement location.
Public/Granted literature
- US20110108736A1 SACP Method and Particle Optical System for Performing the Method Public/Granted day:2011-05-12
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