Invention Grant
US09112499B2 Field programmable gate arrays using resistivity-sensitive memories
有权
使用电阻率敏感存储器的现场可编程门阵列
- Patent Title: Field programmable gate arrays using resistivity-sensitive memories
- Patent Title (中): 使用电阻率敏感存储器的现场可编程门阵列
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Application No.: US13724789Application Date: 2012-12-21
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Publication No.: US09112499B2Publication Date: 2015-08-18
- Inventor: Robert Norman
- Applicant: Unity Semiconductor Corporation
- Applicant Address: US CA Sunnyvale
- Assignee: Unity Semiconductor Corporation
- Current Assignee: Unity Semiconductor Corporation
- Current Assignee Address: US CA Sunnyvale
- Agency: Stolowitz Ford Cowger LLP
- Main IPC: H03K19/177
- IPC: H03K19/177

Abstract:
Field programmable gate arrays using resistivity-sensitive memories are described, including a programmable cell comprising a configurable logic, a memory connected to the configurable logic to provide functions for the configurable logic, the memory comprises a non-volatile rewriteable memory element including a resistivity-sensitive memory element, an input/output logic connected to the configurable logic and the memory to communicate with other cells. The memory elements may be two-terminal resistivity-sensitive memory elements that store data in the absence of power. The two-terminal memory elements may store data as plurality of conductivity profiles that can be non-destructively read by applying a read voltage across the terminals of the memory element and data can be written to the two-terminal memory elements by applying a write voltage across the terminals. The memory can be vertically configured in one or more memory planes that are vertically stacked upon each other and are positioned above a logic plane.
Public/Granted literature
- US20130222010A1 FIELD PROGRAMMABLE GATE ARRAYS USING RESISTIVITY-SENSITIVE MEMORIES Public/Granted day:2013-08-29
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