Invention Grant
- Patent Title: Data pattern generation for I/O training and characterization
- Patent Title (中): 用于I / O培训和表征的数据模式生成
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Application No.: US14017277Application Date: 2013-09-03
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Publication No.: US09122570B2Publication Date: 2015-09-01
- Inventor: Timothy M. Hollis , Jeffrey P Wright , Kang-Yong Kim , Eric J. Stave
- Applicant: NANYA TECHNOLOGY CORP.
- Applicant Address: TW Gueishan Dist., Taoyuan
- Assignee: NANYA TECHNOLOGY CORP.
- Current Assignee: NANYA TECHNOLOGY CORP.
- Current Assignee Address: TW Gueishan Dist., Taoyuan
- Agent Winston Hsu; Scott Margo
- Main IPC: G06F3/00
- IPC: G06F3/00 ; G11C29/00 ; G01R31/28 ; G06F13/00 ; G06F3/06 ; G06F12/00

Abstract:
A memory structure that can perform characterization of output data paths without accessing the main memory array includes: a plurality of output data paths; a plurality of registers coupled to the output data paths. The registers include: at least a first pattern register and a second pattern register, for respectively storing a first data pattern and a second data pattern; and at least a first mapping register, for storing a plurality of binary values, wherein each binary value indicates whether the first data pattern or the second data pattern should be mapped to a corresponding output data path.
Public/Granted literature
- US20150067197A1 DATA PATTERN GENERATION FOR I/O TRAINING AND CHARACTERIZATION Public/Granted day:2015-03-05
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