Invention Grant
- Patent Title: Automated feature analysis, comparison, and anomaly detection
- Patent Title (中): 自动特征分析,比较和异常检测
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Application No.: US14077134Application Date: 2013-11-11
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Publication No.: US09122956B1Publication Date: 2015-09-01
- Inventor: Wolfgang Fink
- Applicant: CALIFORNIA INSTITUTE OF TECHNOLOGY
- Applicant Address: US CA Pasadena
- Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGY
- Current Assignee: CALIFORNIA INSTITUTE OF TECHNOLOGY
- Current Assignee Address: US CA Pasadena
- Agency: Steinfl & Bruno LLP
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06K9/42

Abstract:
Novel methods and systems for automated data analysis are disclosed. Data can be automatically analyzed to determine features in different applications, such as visual field analysis and comparisons. Anomalies between groups of objects may be detected through clustering of objects.
Public/Granted literature
- US20150262035A1 AUTOMATED FEATURE ANALYSIS, COMPARISON, AND ANOMALY DETECTION Public/Granted day:2015-09-17
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