Invention Grant
- Patent Title: Electron impact ion source with fast response
- Patent Title (中): 电子冲击离子源具有快速响应
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Application No.: US14397274Application Date: 2013-04-26
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Publication No.: US09123521B2Publication Date: 2015-09-01
- Inventor: Anatoly N. Verenchikov
- Applicant: LECO Corporation
- Applicant Address: US MI St. Joseph
- Assignee: LECO Corporation
- Current Assignee: LECO Corporation
- Current Assignee Address: US MI St. Joseph
- Agency: Honigman Miller Schwartz and Cohn LLP
- International Application: PCT/US2013/038388 WO 20130426
- International Announcement: WO2013/163530 WO 20131031
- Main IPC: H01J49/00
- IPC: H01J49/00 ; B01D59/44 ; H01J49/14 ; G01N30/72 ; H01J49/40

Abstract:
A closed electron impact ion source with overall opening area of less than 30 mm2 is employed for direct and pulsed extraction into a time-flight mass spectrometer in order to enhance sensitivity and immunity to chemical noise of oil and fumes of the vacuum system. For compatibility with dual stage GCxGC separation, the source may contain an inert liner surrounded by an isothermal cage of thermally conductive material. The source inner surface may be reduced to under 100 mm2. A portion of carrier gas may be pumped down before admitting the sample and carrier gas into the source. A cooled surface may be used to condense fumes at the analysis time.
Public/Granted literature
- US20150144779A1 Electron Impact Ion Source With Fast Response Public/Granted day:2015-05-28
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