Invention Grant
- Patent Title: Wavelength-tunable interference filter, optical module, and optical analysis apparatus
- Patent Title (中): 波长可调干涉滤波器,光模块和光分析仪
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Application No.: US13216509Application Date: 2011-08-24
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Publication No.: US09128279B2Publication Date: 2015-09-08
- Inventor: Akira Sano
- Applicant: Akira Sano
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2010-188506 20100825
- Main IPC: G01N21/25
- IPC: G01N21/25 ; G01B9/02 ; G02B26/00 ; G01J3/26 ; G01J3/46 ; G01J3/50

Abstract:
A wavelength-tunable interference filter comprising a first substrate, a second substrate facing the first substrate, a first reflective film provided on the first substrate, a second reflective film provided on the second substrate, the second reflective film facing the first reflective film, a first electrode provided on the first substrate, and a second electrode provided on the second substrate, the second electrode facing the first electrode, wherein the first electrode includes a first electrode layer and a second electrode layer, the first electrode layer has a first in-plane internal stress which is compressive, and the second electrode layer has a second in-plane internal stress which is tensile.
Public/Granted literature
- US20120050742A1 WAVELENGTH-TUNABLE INTERFERENCE FILTER, OPTICAL MODULE, AND OPTICAL ANALYSIS APPARATUS Public/Granted day:2012-03-01
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