Invention Grant
- Patent Title: Parallel ion mass and ion mobility analysis
- Patent Title (中): 平行离子质量和离子迁移率分析
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Application No.: US14338250Application Date: 2014-07-22
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Publication No.: US09142395B2Publication Date: 2015-09-22
- Inventor: Ching Wu , Clinton Alawn Krueger , Anthony Joseph Midey , Mark A Osgood
- Applicant: Excellims Corporation
- Applicant Address: US MA Actor
- Assignee: Excelliris Corp.
- Current Assignee: Excelliris Corp.
- Current Assignee Address: US MA Actor
- Main IPC: H01J49/00
- IPC: H01J49/00 ; G01N27/62 ; G01N30/72
Abstract:
The present invention relates to a parallel IMS and MS measurement method where a sample flow is split and delivered to an IMS and a MS in parallel. A parallel acquisition MS/IMS method is used to supplement LC-MS and or MS data by using a synchronized MS/IMS acquisition.
Public/Granted literature
- US20140367567A1 PARALLEL ION MASS AND ION MOBILITY ANALYSIS Public/Granted day:2014-12-18
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