Invention Grant
- Patent Title: Method and system for quantitative and qualitative analysis using mass spectrometry
- Patent Title (中): 使用质谱定量和定性分析的方法和系统
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Application No.: US14367235Application Date: 2012-11-28
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Publication No.: US09202676B2Publication Date: 2015-12-01
- Inventor: John Lawrence Campbell , James Hager
- Applicant: DH Technologies Development Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee: DH Technologies Development Pte. Ltd.
- Current Assignee Address: SG Singapore
- International Application: PCT/IB2012/002523 WO 20121128
- International Announcement: WO2013/093582 WO 20130627
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/42

Abstract:
In some embodiments, a quantitative analysis of at least one ion signal associated with a sample, which is detected by a mass spectrometer having at least two tandem quadrupole instruments, is employed to select one of the following operational modes for further mass analysis of the sample: (a) utilizing both quadrupole instruments as mass resolving filters, and (b) utilizing one quadrupole instrument as a mass resolving filter and utilizing the other as a linear ion trap. In some embodiments, the quantitative analysis of the ion signal comprises comparing the ion signal intensity with a predefined threshold.
Public/Granted literature
- US20150235828A1 METHOD AND SYSTEM FOR QUANTITATIVE AND QUALITATIVE ANALYSIS USING MASS SPECTROMETRY Public/Granted day:2015-08-20
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