Invention Grant
US09218934B2 Charged particle beam system and method of operating a charged particle beam system
有权
带电粒子束系统和操作带电粒子束系统的方法
- Patent Title: Charged particle beam system and method of operating a charged particle beam system
- Patent Title (中): 带电粒子束系统和操作带电粒子束系统的方法
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Application No.: US14314262Application Date: 2014-06-25
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Publication No.: US09218934B2Publication Date: 2015-12-22
- Inventor: John A. Notte, IV , Weijie Huang , FHM-Faridur Rahman , Shawn McVey
- Applicant: Carl Zeiss Microscopy, LLC
- Applicant Address: US NY Thornwood
- Assignee: Carl Zeiss Microscopy, LLC
- Current Assignee: Carl Zeiss Microscopy, LLC
- Current Assignee Address: US NY Thornwood
- Agency: Fish & Richardson P.C.
- Main IPC: H01J27/26
- IPC: H01J27/26 ; H01J37/08 ; H01J37/18 ; G21K5/04

Abstract:
The disclosure relates to a method of operating a gas field ion beam system in which the gas field ion beam system comprises an external housing, an internal housing, arranged within the external housing, an electrically conductive tip arranged within the internal housing, a gas supply for supplying one or more gases to the internal housing, the gas supply having a tube terminating within the internal housing, and an extractor electrode having a hole to permit ions generated in the neighborhood of the tip to pass through the hole into the external housing. The method comprises the step of regularly heating the external housing, the internal housing, the electrically conductive tip, the tube and the extractor electrode to a temperature of above 100° C.
Public/Granted literature
- US20150008333A1 Charged Particle Beam System and Method of Operating a Charged Particle Beam System Public/Granted day:2015-01-08
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