To accurately measure a frequency characteristic of a waveform generating apparatus, provided is a measurement apparatus that measures a frequency characteristic of a waveform generating apparatus generating a signal having a waveform corresponding to waveform data, comprising a control section that causes a plurality of sine wave signals having different frequencies to be sequentially output from the waveform generating apparatus; a measuring section that measures each of the sine wave signals output from the waveform generating apparatus; and a calculating section that calculates a frequency characteristic of the waveform generating apparatus based on the measurement results of the measuring section. The control section causes trigger signals to be output from the waveform generating apparatus and causes the sine wave signals to be output in synchronization with the trigger signals, and the measuring section measures a phase of each sine wave signal with the corresponding trigger signal as a reference.