Invention Grant
- Patent Title: Detection apparatus for light-emitting diode chip
- Patent Title (中): 发光二极管芯片检测装置
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Application No.: US13836181Application Date: 2013-03-15
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Publication No.: US09229065B2Publication Date: 2016-01-05
- Inventor: Tai-Wei Wu , Tai-Cheng Tsai , Hsin-Hung Lin , Ping-Tsung Tsai , Pei-Yi Huang , Gwo-Jiun Sheu , Shou-Wen Hsu , Yun-Li Li
- Applicant: GENESIS PHOTONICS INC
- Applicant Address: TW Tainan
- Assignee: Genesis Photonics Inc.
- Current Assignee: Genesis Photonics Inc.
- Current Assignee Address: TW Tainan
- Agency: Muncy, Geisseler, Olds & Lowe, P.C.
- Priority: TW101146326A 20121210
- Main IPC: G01J1/00
- IPC: G01J1/00 ; G01R31/44 ; G01R31/26 ; G01J1/42

Abstract:
A detection apparatus for light-emitting diode chip comprising a substrate with the function of photoelectric conversion and a probing device is disclosed. The substrate is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two conductive elements. The two ends of the conductive elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Some of the light beams are emitted from the light-emitting diode chip toward the substrate such that the light beams emitted by the light-emitting diode chip are converted into an electric signal by the substrate.
Public/Granted literature
- US20140159732A1 DETECTION APPARATUS FOR LIGHT-EMITTING DIODE CHIP Public/Granted day:2014-06-12
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