Invention Grant
- Patent Title: Method and device for high resolution full field interference microscopy
- Patent Title (中): 高分辨率全场干涉显微镜的方法和装置
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Application No.: US13808739Application Date: 2011-07-08
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Publication No.: US09255785B2Publication Date: 2016-02-09
- Inventor: Albert Claude Boccara , Fabrice Harms , Bertrand Le Conte Chrestien De Poly
- Applicant: Albert Claude Boccara , Fabrice Harms , Bertrand Le Conte Chrestien De Poly
- Applicant Address: FR Paris
- Assignee: LLTECH MANAGEMENT
- Current Assignee: LLTECH MANAGEMENT
- Current Assignee Address: FR Paris
- Agency: Osha Liang LLP
- Priority: FR1057268 20100913
- International Application: PCT/EP2011/061633 WO 20110708
- International Announcement: WO2012/004388 WO 20120112
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G01B9/02 ; A61B5/00 ; G01B11/24 ; G01J3/02 ; G01J3/10 ; G01J3/28 ; G01J3/45 ; G02B21/14

Abstract:
A device for three-dimensional imaging by full-field interferential microscopy of a volumic and scattering sample includes an imaging interferometer of variable magnification, allowing for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of the incident wave on a reference mirror and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of the sample. The invention also relates to a processing unit that processes the interferometric images, a unit for axially displacing the interferometer relative to the sample for the acquisition of tomographic images for slices at different depths of the sample, and a unit for varying the magnification of the imaging interferometer for the acquisition of interferometric images of a slice for different magnification values.
Public/Granted literature
- US20130107275A1 METHOD AND DEVICE FOR HIGH RESOLUTION FULL FIELD INTERFERENCE MICROSCOPY Public/Granted day:2013-05-02
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