Invention Grant
US09255844B2 System and method for optical measurement of a target at multiple positions
有权
在多个位置对目标进行光学测量的系统和方法
- Patent Title: System and method for optical measurement of a target at multiple positions
- Patent Title (中): 在多个位置对目标进行光学测量的系统和方法
-
Application No.: US14024832Application Date: 2013-09-12
-
Publication No.: US09255844B2Publication Date: 2016-02-09
- Inventor: Mikko Juuti , Heikki Saari , Heimo Keranen , Jouko Malinen
- Applicant: Teknologian tutkimuskeskus VTT
- Applicant Address: FI Vtt
- Assignee: TEKNOLOGIAN TUTKIMUSKESKUS VTT
- Current Assignee: TEKNOLOGIAN TUTKIMUSKESKUS VTT
- Current Assignee Address: FI Vtt
- Agency: Young & Thompson
- Priority: FI20125944 20120912
- Main IPC: G01J3/45
- IPC: G01J3/45 ; G01B9/02 ; G01J3/51 ; G01J3/02 ; G01J3/10 ; G01J3/26 ; G01J3/28 ; G01J3/32 ; G01J3/36

Abstract:
The invention relates to a system and a method for optical measurement of a target, wherein the target is illuminated, either actively illuminated, reflecting ambient light, or self illuminating, and a measurement radiation beam received from the target or through it is detected. The measurement system has optical fibers for guiding radiation from/to target positions. Radiation of several target positions is simultaneously filtered by a Fabry-Perot interferometer and detected by a row detector, for example.
Public/Granted literature
- US20140071451A1 SYSTEM AND METHOD FOR OPTICAL MEASUREMENT OF A TARGET AT MULTIPLE POSITIONS Public/Granted day:2014-03-13
Information query