Invention Grant
US09269130B2 Image correction method using approximately non-linear regression approach and related image correction circuit
有权
使用近似非线性回归方法和相关图像校正电路的图像校正方法
- Patent Title: Image correction method using approximately non-linear regression approach and related image correction circuit
- Patent Title (中): 使用近似非线性回归方法和相关图像校正电路的图像校正方法
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Application No.: US13858101Application Date: 2013-04-08
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Publication No.: US09269130B2Publication Date: 2016-02-23
- Inventor: Shih-Tse Chen , Hao-Tien Chiang
- Applicant: Realtek Semiconductor Corp.
- Applicant Address: TW Science Park, HsinChu
- Assignee: Realtek Semiconductor Corp.
- Current Assignee: Realtek Semiconductor Corp.
- Current Assignee Address: TW Science Park, HsinChu
- Agent Winston Hsu; Scott Margo
- Priority: TW102100886A 20130110
- Main IPC: G06T5/00
- IPC: G06T5/00
Abstract:
An image correction method arranged for processing an original image to obtain a corrected image includes steps: receiving the original image from an image sensor; regarding each pixel of the original image, calculating a horizontal distance and a vertical distance between the pixel and a reference point in the original image; determining a horizontal ratio parameter and a vertical ratio parameter according to the horizontal distance and the vertical distance between the pixel and the reference point in the original image; and performing an approximately non-linear regression calculation on the horizontal ratio parameter, the vertical ratio parameter and a coordinate of the pixel to obtain a position of the pixel in the corrected image.
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