Invention Grant
- Patent Title: Downhole mass spectrometry
- Patent Title (中): 井下质谱
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Application No.: US12690168Application Date: 2010-01-20
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Publication No.: US09274248B2Publication Date: 2016-03-01
- Inventor: Julian J. Pop , Reza Taherian , Pierre J. Daniel
- Applicant: Julian J. Pop , Reza Taherian , Pierre J. Daniel
- Applicant Address: US TX Sugar Land
- Assignee: Schlumberger Technology Corporation
- Current Assignee: Schlumberger Technology Corporation
- Current Assignee Address: US TX Sugar Land
- Agent Kenneth L. Kincaid
- Main IPC: G01V5/00
- IPC: G01V5/00 ; G01V9/00 ; H01J49/00

Abstract:
A method comprising using a first mass analyzer of a downhole tool to isolate specific ions within a sample received in the downhole tool, using a second mass analyzer of the downhole tool to stabilize the ions isolated by the first mass analyzer, and using a third mass analyzer of the downhole tool to catalog the stabilized ions.
Public/Granted literature
- US20100181471A1 DOWNHOLE MASS SPECTROMETRY Public/Granted day:2010-07-22
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