Invention Grant
- Patent Title: Method and system for calibrating laser measuring apparatus
- Patent Title (中): 用于校准激光测量装置的方法和系统
-
Application No.: US14451451Application Date: 2014-08-05
-
Publication No.: US09275431B2Publication Date: 2016-03-01
- Inventor: Tzung-Han Lin
- Applicant: National Taiwan University of Science and Technology
- Applicant Address: TW Taipei
- Assignee: National Taiwan University of Science and Technology
- Current Assignee: National Taiwan University of Science and Technology
- Current Assignee Address: TW Taipei
- Agency: Jianq Chyun IP Office
- Priority: TW102148014A 20131224
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T3/00 ; G01B11/25 ; G06T7/00

Abstract:
A method for calibrating a laser measuring apparatus having a laser illumination unit and an image capturing unit includes the following steps. A calibration board having at least one slit gap and a plurality of markers is provided. The relative position between the calibration board and the laser illumination unit is adjusted to allow a slit laser beam emitted by the laser illumination unit to pass through the at least one slit. The calibration board is captured by the image capturing unit to generate a calibration board image. The calibration board image is processed so as to obtain a camera coordinate of each of the markers. A plurality of calibration parameters are calculated according to the camera coordinate and an actual coordinate of each of the markers so as to obtain actual coordinates of an object captured in an object image generated by the laser measuring apparatus.
Public/Granted literature
- US20150178910A1 METHOD AND SYSTEM FOR CALIBRATING LASER MEASURING APPARATUS Public/Granted day:2015-06-25
Information query