Invention Grant
- Patent Title: Microscopy support structures
- Patent Title (中): 显微支架结构
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Application No.: US14525894Application Date: 2014-10-28
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Publication No.: US09275826B2Publication Date: 2016-03-01
- Inventor: John Damiano, Jr. , Stephen E. Mick , David P. Nackashi
- Applicant: PROTOCHIPS, INC.
- Applicant Address: US NC Morrisville
- Assignee: PROTOCHIPS, INC.
- Current Assignee: PROTOCHIPS, INC.
- Current Assignee Address: US NC Morrisville
- Agency: Moore & Van Allen, PLLC
- Agent Tristan A. Fuierer
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/26

Abstract:
Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
Public/Granted literature
- US20150179397A1 MICROSCOPY SUPPORT STRUCTURES Public/Granted day:2015-06-25
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