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1.发明授权公开(公告)号：US09666409B2
公开(公告)日：2017-05-30
申请号：US15288239
申请日：2016-10-07
Applicant: Protochips, Inc.
Inventor： John Damiano, Jr. , David P. Nackashi , Stephen E. Mick
CPC classification number: H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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公开(公告)号：US20150129778A1
公开(公告)日：2015-05-14
申请号：US14513969
申请日：2014-10-14
Applicant: PROTOCHIPS, INC.
Inventor： David P. Nackashi , John Damiano, Jr. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
CPC classification number: H01J37/20 , G01N1/28 , H01J2237/2002 , H01J2237/2007 , H01J2237/2008 , H01J2237/202 , H01J2237/26
Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
Abstract translation: 用于插入电子显微镜的样品支撑装置的新型样品架。 本发明的新型样品保持器为样品支撑装置提供机械支撑，以及对试样或样品支撑装置的电接触。
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公开(公告)号：US20130146784A1
公开(公告)日：2013-06-13
申请号：US13758839
申请日：2013-02-04
Applicant: PROTOCHIPS, INC.
Inventor： David P. Nackashi , John Damiano, JR. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
IPC: H01J37/20
CPC classification number: H01J37/20 , G01N1/28 , H01J2237/2007 , H01J2237/2008
Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
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4.发明授权公开(公告)号：US10192714B2
公开(公告)日：2019-01-29
申请号：US15608823
申请日：2017-05-30
Applicant: Protochips, Inc.
Inventor： John Damiano, Jr. , David P. Nackashi , Stephen E. Mick
Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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5.发明申请公开(公告)号：US20170278670A1
公开(公告)日：2017-09-28
申请号：US15608823
申请日：2017-05-30
Applicant: Protochips, Inc.
Inventor： John Damiano, JR. , David P. Nackashi , Stephen E. Mick
CPC classification number: H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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Patent Agency Ranking
6.发明授权Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices 有权用于形成具有两个半导体器件的气体或液体电池的电子显微镜样品架公开(公告)号：US09324539B2
公开(公告)日：2016-04-26
申请号：US14481390
申请日：2014-09-09
Applicant: PROTOCHIPS, INC.
Inventor： John Damiano, Jr. , David P. Nackashi , Stephen E. Mick
CPC classification number: H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
Abstract translation: 用于插入电子显微镜的样品支撑装置的新型样品架。 本发明的新型样品保持器允许将气体或液体引入用于原位成像的样品，以及用于电化学或热学实验的电触点。
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公开(公告)号：US09275826B2
公开(公告)日：2016-03-01
申请号：US14525894
申请日：2014-10-28
Applicant: PROTOCHIPS, INC.
Inventor： John Damiano, Jr. , Stephen E. Mick , David P. Nackashi
CPC classification number: H01J37/20 , H01J37/26 , H01J37/261 , H01J2237/188 , H01J2237/2001 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/2602 , H01J2237/28 , H01J2237/2802
Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
Abstract translation: 电子显微镜支撑结构及其制作和使用方法。 支撑结构通常使用半导体材料和半导体制造工艺构造。 可以控制支撑结构的温度和/或气体或液体被限制在观察区域中用于反应和/或成像。
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8.发明授权Sample holder providing interface to semiconductor device with high density connections 有权样品架提供与高密度连接的半导体器件的接口公开(公告)号：US08872128B2
公开(公告)日：2014-10-28
申请号：US13920419
申请日：2013-06-18
Applicant: Protochips, Inc.
Inventor： John Damiano, Jr. , Stephen E. Mick , David P. Nackashi , Montie Roland , Paul Hakenewerth
CPC classification number: H01J37/20 , H01J37/26 , H01J2237/2007 , H01J2237/2008
Abstract: A novel specimen holder for specimen support specimen support devices for insertion in electron microscopes is provided. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
Abstract translation: 提供了一种用于样品支架的样品支架，用于插入电子显微镜中的样品支撑装置。 本发明的新型样品保持器为样品支撑装置提供机械支撑，以及对试样或样品支撑装置的电接触。
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公开(公告)号：US20130206984A1
公开(公告)日：2013-08-15
申请号：US13799871
申请日：2013-03-13
Applicant: PROTOCHIPS, INC.
Inventor： David P. Nackashi , John Damiano, JR. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
IPC: H01J37/20
CPC classification number: H01J37/20 , G01N1/28 , H01J2237/2007 , H01J2237/2008
Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
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10.发明授权公开(公告)号：US10043633B2
公开(公告)日：2018-08-07
申请号：US14994724
申请日：2016-01-13
Applicant: PROTOCHIPS, INC.
Inventor： John Damiano, Jr. , David P. Nackashi , Stephen E. Mick
CPC classification number: H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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