Invention Grant
- Patent Title: Wafer handling systems and methods
- Patent Title (中): 晶圆处理系统和方法
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Application No.: US14203237Application Date: 2014-03-10
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Publication No.: US09281222B2Publication Date: 2016-03-08
- Inventor: William Tyler Weaver , Malcolm N. Daniel, Jr. , Robert B. Vopat , Jason M. Schaller , Jacob Newman , Dinesh Kanawade , Andrew J. Constant , Stephen C. Hickerson , Jeffrey C. Hudgens , Marvin L. Freeman
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Dugan & Dugan, PC
- Main IPC: H01L21/67
- IPC: H01L21/67 ; H01L21/677

Abstract:
A wafer handling system may include upper and lower linked robot arms that may move a wafer along a nonlinear trajectory between chambers of a semiconductor processing system. These features may result in a smaller footprint in which the semiconductor processing system may operate, smaller transfer chambers, smaller openings in process chambers, and smaller slit valves, while maintaining high wafer throughput. In some embodiments, simultaneous fast wafer swaps between two separate chambers, such as load locks and ALD (atomic layer deposition) carousels, may be provided. Methods of wafer handling are also provided, as are other aspects.
Public/Granted literature
- US20140271050A1 WAFER HANDLING SYSTEMS AND METHODS Public/Granted day:2014-09-18
Information query
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