Invention Grant
- Patent Title: Electron gun abnormality detecting device and electron gun abnormality detecting method
- Patent Title (中): 电子枪异常检测装置和电子枪异常检测方法
-
Application No.: US14431221Application Date: 2013-09-25
-
Publication No.: US09304078B2Publication Date: 2016-04-05
- Inventor: Tomohiko Ito , Junichi Yotsuji , Shigehiro Takajo , Hiroi Yamaguchi , Kazuhiro Hanazawa , Yasunari Koga
- Applicant: JFE STEEL CORPORATION
- Applicant Address: JP Tokyo
- Assignee: JFE STEEL CORPORATION
- Current Assignee: JFE STEEL CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2012-216381 20120928
- International Application: PCT/JP2013/075942 WO 20130925
- International Announcement: WO2014/050906 WO 20140403
- Main IPC: G01J4/00
- IPC: G01J4/00 ; G01N21/21 ; G01R33/032 ; H01J29/48

Abstract:
An electron gun abnormality detecting device for detecting an abnormality in first and second electron guns of a magnetic domain refining device for an electrical steel sheet includes: a magnetooptic element configured to contact with and separate from an inspection region set to include a boundary between a magnetic domain discontinuity generated by irradiation of a surface of the electrical steel sheet with an electron beam by the first electron gun and a magnetic domain discontinuity generated by irradiation thereof with an electron beam by the second electron gun, and configured to detect a steel sheet magnetic domain structure in the inspection region as an optical property; a light source configured to irradiate the magnetooptic element with linearly polarized light; and a detector configured to detect polarized light rotated by the steel sheet magnetic domain structure transferred to the magnetooptic element.
Public/Granted literature
- US20150241335A1 ELECTRON GUN ABNORMALITY DETECTING DEVICE AND ELECTRON GUN ABNORMALITY DETECTING METHOD Public/Granted day:2015-08-27
Information query