Invention Grant
US09312097B2 Specimen holder used for mounting samples in electron microscopes
有权
用于将样品安装在电子显微镜中的样品架
- Patent Title: Specimen holder used for mounting samples in electron microscopes
- Patent Title (中): 用于将样品安装在电子显微镜中的样品架
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Application No.: US14513969Application Date: 2014-10-14
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Publication No.: US09312097B2Publication Date: 2016-04-12
- Inventor: David P. Nackashi , John Damiano, Jr. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
- Applicant: PROTOCHIPS, INC.
- Applicant Address: US NC Morrisville
- Assignee: PROTOCHIPS, INC.
- Current Assignee: PROTOCHIPS, INC.
- Current Assignee Address: US NC Morrisville
- Agency: Moore & Van Allen, PLLC
- Agent Tristan A. Fuierer
- Main IPC: G21K5/08
- IPC: G21K5/08 ; H01J37/20 ; G01N1/28
Abstract:
A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
Public/Granted literature
- US20150129778A1 SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES Public/Granted day:2015-05-14
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