Invention Grant
- Patent Title: Wavelength-resolving and high spatial resolution fluorescence microscopy
- Patent Title (中): 波长分辨率和高空间分辨率荧光显微镜
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Application No.: US13774539Application Date: 2013-02-22
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Publication No.: US09322780B2Publication Date: 2016-04-26
- Inventor: Thomas Kalkbrenner , Ralf Wolleschensky
- Applicant: Carl Zeiss Microscopy GmbH
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Patterson Thuente Pedersen, P.A.
- Priority: DE102012202730 20120222
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G02B21/16 ; G01J3/18 ; G01J3/44

Abstract:
A method for wavelength-resolving and high spatial resolution fluorescence microscopy in which fluorescence labels in a sample are repeatedly excited to emit fluorescence radiation and frames including images of isolated labels are produced with a microscope. The positions of the images of the isolated fluorescing labels are localized with a localization precision exceeding the optical resolution of the imaging beam path of the microscope. The imaging beam path of the microscope has a diffractive element which, during the imaging, diffracts the image of the sample comprising the isolated fluorescing labels into a first diffraction order so that each frame contains the first diffraction order images of the isolated fluorescing labels. A parameter of the first diffraction order images of the isolated fluorescing labels is evaluated and an indication of the wavelength of the isolated fluorescing labels is derived from this evaluated parameter.
Public/Granted literature
- US20130228704A1 WAVELENGTH-RESOLVING AND HIGH SPATIAL RESOLUTION FLUORESCENCE MICROSCOPY Public/Granted day:2013-09-05
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