Invention Grant
- Patent Title: Impedance measurement apparatus
- Patent Title (中): 阻抗测量装置
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Application No.: US14319914Application Date: 2014-06-30
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Publication No.: US09329215B2Publication Date: 2016-05-03
- Inventor: Yuki Endo , Yasuo Furukawa , Tomoaki Ueda
- Applicant: ADVANTEST CORPORATION
- Applicant Address: JP
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP
- Agency: Cantor Colburn LLP
- Priority: JP2013-157019 20130729
- Main IPC: G01R27/02
- IPC: G01R27/02

Abstract:
A measurement auxiliary circuit is configured to form a resonance circuit together with a detection target. An ATAC is coupled with the resonance circuit. A signal generator applies an AC probe signal VS to the resonance circuit. After the impedance measurement apparatus enters a stable state, an impedance detection unit measures a voltage at at least one node and/or a current that flows through at least one current path. The impedance detection unit detects the impedance of the detection target based on the measurement value.
Public/Granted literature
- US20150028891A1 IMPEDANCE MEASUREMENT APPARATUS Public/Granted day:2015-01-29
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