Invention Grant
- Patent Title: Simultaneous inorganic mass spectrometer and method of inorganic mass spectrometry
- Patent Title (中): 无机质谱仪同时测定和无机质谱法
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Application No.: US14323275Application Date: 2014-07-03
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Publication No.: US09330892B2Publication Date: 2016-05-03
- Inventor: Dirk Ardelt , Ulrich Heynen , Adi A. Scheidemann
- Applicant: Spectro Analytical Instruments GmbH
- Applicant Address: DE Kleve
- Assignee: SPECTRO ANALYTICAL INSTRUMENTS GMBH
- Current Assignee: SPECTRO ANALYTICAL INSTRUMENTS GMBH
- Current Assignee Address: DE Kleve
- Agency: Pantich Schwarze Belisario & Nadel LLP
- Main IPC: H01J49/02
- IPC: H01J49/02 ; H01J49/32 ; B01D59/44

Abstract:
An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.
Public/Granted literature
- US20140312219A1 SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MASS SPECTROMETRY Public/Granted day:2014-10-23
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