Invention Grant
- Patent Title: Charged particle beam irradiation apparatus
- Patent Title (中): 带电粒子束照射装置
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Application No.: US14370763Application Date: 2012-12-25
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Publication No.: US09343265B2Publication Date: 2016-05-17
- Inventor: Asako Kaneko , Hisayuki Takasu , Hirobumi Mutou
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge P.C.
- Priority: JP2012-000878 20120106
- International Application: PCT/JP2012/083439 WO 20121225
- International Announcement: WO2013/103107 WO 20130711
- Main IPC: C23C14/35
- IPC: C23C14/35 ; H01J37/305 ; C23C14/50 ; C23C16/458 ; C23C8/40 ; H01J37/20 ; H01J37/16 ; H01J37/18

Abstract:
The purpose of the present invention is to provide a charged particle beam irradiation apparatus of a relatively simple structure which performs cooling on a sample or a sample stage. An aspect of the present invention comprises: a charged particle source; a sample stage; and a driving mechanism that comprises a transmission mechanism which transmits a driving force to move the sample stage. The charged particle beam irradiation apparatus comprises a container capable of accommodating an ionic liquid (12), wherein the container is disposed in a vacuum chamber. When the ionic liquid (12) is accommodated in the container, at least a portion of the transmission mechanism is provided at a position submerged in the ionic liquid (12).
Public/Granted literature
- US20140353151A1 CHARGED PARTICLE BEAM IRRADIATION APPARATUS Public/Granted day:2014-12-04
Information query
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