Invention Grant
US09355816B2 Program for correcting charged particle radiation location, device for calculating degree of correction of charged particle radiation location, charged particle radiation system, and method for correcting charged particle radiation location
有权
用于校正带电粒子辐射位置的程序,用于计算带电粒子辐射位置校正程度的装置,带电粒子辐射系统以及用于校正带电粒子辐射位置的方法
- Patent Title: Program for correcting charged particle radiation location, device for calculating degree of correction of charged particle radiation location, charged particle radiation system, and method for correcting charged particle radiation location
- Patent Title (中): 用于校正带电粒子辐射位置的程序,用于计算带电粒子辐射位置校正程度的装置,带电粒子辐射系统以及用于校正带电粒子辐射位置的方法
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Application No.: US14773233Application Date: 2014-01-22
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Publication No.: US09355816B2Publication Date: 2016-05-31
- Inventor: Yohei Ookawa , Hidenori Ozawa
- Applicant: Dai Nippon Printing Co., Ltd.
- Applicant Address: JP Tokyo
- Assignee: DAI NIPPONI PRINTING CO., LTD.
- Current Assignee: DAI NIPPONI PRINTING CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Locke Lord LLP
- Priority: JP2013-055276 20130318
- International Application: PCT/JP2014/051308 WO 20140122
- International Announcement: WO2014/148096 WO 20140925
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H01J37/304 ; H01J37/317 ; H01J37/20

Abstract:
The present invention provides a non-transitory medium storing a program for correcting an irradiation position of a charged particle beam, a correction amount calculation device, a charged particle beam irradiation system, and a method for correcting an irradiation position of a charged particle beam. The medium includes instructions for causing a control unit to perform actions including replacing charging of a resist with surface charges at an interface between the resist and a work piece, and calculating a charge density distribution of the surface charges; calculating a trajectory of a charged particle based on the charge density distribution; calculating an amount of error of the irradiation position of the charged particle beam based on the trajectory and calculating an amount of correction of the irradiation position of the charged particle beam based on the error amount.
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