Invention Grant
- Patent Title: Specimen preparation for transmission electron microscopy
- Patent Title (中): 透射电子显微镜样品制备
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Application No.: US14412653Application Date: 2013-07-08
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Publication No.: US09384942B2Publication Date: 2016-07-05
- Inventor: Yong-fen Hsieh , Chih-hsun Chu , Pradeep Sharma , Yu-feng Ko , Chung-shi Yang , Lin-ai Tai , Yu-ching Chen , Hsiao-chun Ting
- Applicant: NATIONAL HEALTH RESEARCH INSTITUTES , MATERIALS ANALYSIS TECHNOLOGY (US) CORP
- Applicant Address: TW Miaoli County US CA San Jose
- Assignee: NATIONAL HEALTH RESEARCH INSTITUTES,MATERIALS ANALYSIS TECHNOLOGY (US) CORP.
- Current Assignee: NATIONAL HEALTH RESEARCH INSTITUTES,MATERIALS ANALYSIS TECHNOLOGY (US) CORP.
- Current Assignee Address: TW Miaoli County US CA San Jose
- Agency: Intellectual Property Connections, Inc.
- Agent Hsiu-Ming Saunders
- International Application: PCT/US2013/049595 WO 20130708
- International Announcement: WO2014/011563 WO 20140116
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H01J37/26 ; B01L3/00 ; G01N1/40 ; G01N23/02 ; G01N1/28 ; H01J37/16 ; H01J37/22 ; H01J37/20

Abstract:
A TEM specimen kit is disclosed, which comprises: (a) a top substrate and a bottom substrate, the top and the bottom substrates being transparent and substantially parallel to each other; (b) a first spacer and a second spacer, located beneath the top substrate and sitting on the bottom substrate, the second spacer being opposite to and spaced apart from the first spacer at a distance of d; and (c) a chamber formed between the top and bottom substrate and between the first and second spacer, the chamber having two ends open to the atmosphere and characterized by having a height defined by the thickness h of the spacer, wherein the height being smaller than the diameter of a red blood cell. Also enclosed are methods for preparing a dry specimen for TEM nanoparticle characterization, and methods for analyzing TEM images of nanoparticles in a liquid sample.
Public/Granted literature
- US20150194288A1 SPECIMEN PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY Public/Granted day:2015-07-09
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