Invention Grant
- Patent Title: Mass analysis device and mass calibration method
- Patent Title (中): 质量分析装置和质量校准方法
-
Application No.: US14441579Application Date: 2012-11-09
-
Publication No.: US09384957B2Publication Date: 2016-07-05
- Inventor: Shinichi Yamaguchi
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto-shi
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto-shi
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2012/079168 WO 20121109
- International Announcement: WO2014/073094 WO 20140515
- Main IPC: H01J49/26
- IPC: H01J49/26 ; H01J49/02

Abstract:
In conducting multiple repetitions of MS/MS analysis on the same test sample for which a precursor ion whose m/z is known (m/z=M) has been established, MS/MS analysis is conducted under a dissociation condition in which CID is less prone to occur in part of the analysis. When an MS/MS spectrum is created by summing up spectral data thus obtained, a known precursor ion is observed at m/z=M without exception. Thus, a peak corresponding to the precursor ion is detected on the MS/MS spectrum, a mass deviation between an actual measured value and theoretical value M of m/z at the peak is determined, and a spectrum is created by correcting other peaks for mass shifts based on the mass deviation. This makes it possible to mass-calibrate the MS/MS spectrum in substantially the same manner as an internal standard method and improve mass accuracy over conventional methods.
Public/Granted literature
- US20150279649A1 MASS ANALYSIS DEVICE AND MASS CALIBRATION METHOD Public/Granted day:2015-10-01
Information query