Invention Grant
- Patent Title: X-ray fluorescence spectrometer comprising a gas blowing mechanism
- Patent Title (中): X射线荧光光谱仪包括气体吹扫机构
-
Application No.: US14219579Application Date: 2014-03-19
-
Publication No.: US09400255B2Publication Date: 2016-07-26
- Inventor: Hiroaki Nohara , Yoshiki Matoba , Noriaki Sakai , Toshitada Takeuchi
- Applicant: Hitachi High-Tech Science Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: Hitachi High-Tech Science Corporation
- Current Assignee: Hitachi High-Tech Science Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- Agency: Banner & Witcoff, Ltd.
- Priority: JP2013-068420 20130328
- Main IPC: G01N23/223
- IPC: G01N23/223

Abstract:
An X-ray fluorescence spectrometer includes: a sample stage configured to place a sample thereon; an X-ray source configured to irradiate the sample with primary X-rays; a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which includes an X-ray incident window formed by a window material through which fluorescent X-rays is transmittable; and a gas blowing mechanism configured to blow a gas to at least one of an outer surface of the X-ray incident window and the sample stage.
Public/Granted literature
- US20140294143A1 X-Ray Fluorescence Spectrometer Public/Granted day:2014-10-02
Information query