Invention Grant
- Patent Title: Electronic measurements of monolayers following homogeneous reactions of their components
- Patent Title (中): 在其组分的均相反应之后的单层电子测量
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Application No.: US13952215Application Date: 2013-07-26
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Publication No.: US09404883B2Publication Date: 2016-08-02
- Inventor: Yijia Paul Bao , Adam G. Gaustad
- Applicant: OHMX CORPORATION
- Applicant Address: US IL Evanston
- Assignee: OHMX Corporation
- Current Assignee: OHMX Corporation
- Current Assignee Address: US IL Evanston
- Agency: Wolf, Greenfield & Sacks, P.C.
- Main IPC: G01N27/327
- IPC: G01N27/327 ; C12Q1/28 ; G01N33/543
Abstract:
The disclosure relates to novel methods for performing a solution based assay reaction with an electroactive active moiety (EAM) that subsequently forms a self-assembled monolayer (SAM) utilizing the advantages of faster solution reaction kinetics, SAM protected electrode and surface based electrochemistry for electronic measurement.
Public/Granted literature
- US20140027309A1 ELECTRONIC MEASUREMENTS OF MONOLAYERS FOLLOWING HOMOGENEOUS REACTIONS OF THEIR COMPONENTS Public/Granted day:2014-01-30
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