Invention Grant
US09435856B2 Position adjustable probing device and probe card assembly using the same
有权
位置可调探测装置和探针卡组件使用相同
- Patent Title: Position adjustable probing device and probe card assembly using the same
- Patent Title (中): 位置可调探测装置和探针卡组件使用相同
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Application No.: US14253336Application Date: 2014-04-15
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Publication No.: US09435856B2Publication Date: 2016-09-06
- Inventor: Tsung-Yi Chen , Chung-Tse Lee , Shih-Shin Chen
- Applicant: MPI CORPORATION
- Applicant Address: TW Chu-Pei, Hsinchu Shien
- Assignee: MPI CORPORATION
- Current Assignee: MPI CORPORATION
- Current Assignee Address: TW Chu-Pei, Hsinchu Shien
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: TW102113400A 20130416; TW102206910U 20130416; TW102206911U 20130416; TW102214129U 20130726
- Main IPC: G01R31/01
- IPC: G01R31/01 ; G01R31/28 ; G01R1/073

Abstract:
A position adjustable probing device adapted for being mounted to a circuit board includes a frame, a probe head, a space transformer module and an elevation adjusting structure. The frame has a first surface, a second surface opposite to the first surface, and a first opening penetrating through the first and second surfaces. The probe head is coupled to the frame. The space transformer module is disposed in the first opening. The elevation adjusting structure is provided at the frame and has a plurality of spacers for adjusting a position of the frame relative to a reference surface in a vertical direction.
Public/Granted literature
- US20140306729A1 POSITION ADJUSTABLE PROBING DEVICE AND PROBE CARD ASSEMBLY USING THE SAME Public/Granted day:2014-10-16
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