Invention Grant
US09458531B2 Method for directed self-assembly (DSA) of block copolymers using guiding line sidewalls
有权
使用引导线侧壁的嵌段共聚物的定向自组装(DSA)的方法
- Patent Title: Method for directed self-assembly (DSA) of block copolymers using guiding line sidewalls
- Patent Title (中): 使用引导线侧壁的嵌段共聚物的定向自组装(DSA)的方法
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Application No.: US14532240Application Date: 2014-11-04
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Publication No.: US09458531B2Publication Date: 2016-10-04
- Inventor: Julia Cushen , Ricardo Ruiz , Lei Wan
- Applicant: HGST Netherlands B.V.
- Applicant Address: NL Amsterdam
- Assignee: HGST Netherlands B.V.
- Current Assignee: HGST Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Agent Thomas R. Berthold
- Main IPC: B44C1/22
- IPC: B44C1/22 ; C23C14/04

Abstract:
A guiding pattern for directed self-assembly (DSA) of a block copolymer (BCP) is an array of spaced guiding stripes on a substrate that have a width equal to nL0 and a pitch equal to (n+k)L0, where n and k are integers equal to or greater than 1 and L0 is the natural pitch of the BCP. The guiding stripes have oxidized sidewalls. A silicon-containing BCP self-assembles with the BCP component without silicon wetting the oxidized sidewalls. Then oxygen reactive ion etching (RIE) removes the BCP component without silicon and oxidizes the silicon-containing BCP component. The remaining pattern of silicon oxide containing BCP component can then be used as an etch mask to etch the underlying substrate.
Public/Granted literature
- US20160122859A1 METHOD FOR DIRECTED SELF-ASSEMBLY (DSA) OF BLOCK COPOLYMERS USING GUIDING LINE SIDEWALLS Public/Granted day:2016-05-05
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