Invention Grant
US09478384B2 Electrode for producing a plasma, plasma chamber having said electrode, and method for analyzing or processing a layer or the plasma in situ
有权
用于制造等离子体的电极,具有所述电极的等离子体室以及原位分析或处理层或等离子体的方法
- Patent Title: Electrode for producing a plasma, plasma chamber having said electrode, and method for analyzing or processing a layer or the plasma in situ
- Patent Title (中): 用于制造等离子体的电极,具有所述电极的等离子体室以及原位分析或处理层或等离子体的方法
-
Application No.: US13703190Application Date: 2011-07-07
-
Publication No.: US09478384B2Publication Date: 2016-10-25
- Inventor: Stefan Muthmann , Aad Gordijn , Reinhard Carius , Markus Huelsbeck , Dzmitry Hrunski
- Applicant: Stefan Muthmann , Aad Gordijn , Reinhard Carius , Markus Huelsbeck , Dzmitry Hrunski
- Applicant Address: DE Juelich
- Assignee: Forschungszentrum Juelich GmbH
- Current Assignee: Forschungszentrum Juelich GmbH
- Current Assignee Address: DE Juelich
- Agency: Jordan and Kosa, PLLC
- Priority: DE102010027224 20100715
- International Application: PCT/DE2011/001415 WO 20110707
- International Announcement: WO2012/010146 WO 20120126
- Main IPC: H01J37/04
- IPC: H01J37/04 ; H01J37/22 ; H01J37/32 ; H01J1/02 ; C23C14/52 ; C23C16/44 ; C23C16/509 ; C23C16/52 ; G01J3/44

Abstract:
A RF electrode for generating, plasma in a plasma chamber comprising an optical feedthrough. A plasma chamber comprising an RF electrode and a counter-electrode with a substrate support for holding a substrate, wherein a high-frequency alternating field for generating the plasma can be formed between the RF electrode and the counter-electrode. The chamber comprising an RF electrode with an optical feedthrough. A method, for in situ analysis or in situ processing of a layer or plasma in a plasma chamber, wherein the layer is disposed on counter-electrode and an RF electrode is disposed on the side lacing the layer. Selection of an RF electrode having an optical feedthrough, and at least one step in which electromagnetic radiation is supplied through the optical feedthrough for purposes of analysis or processing of the layer or the plasma, and by at least one other step in which the scattered or emitted or reflected radiation is supplied to an analysis unit.
Public/Granted literature
Information query