Invention Grant
- Patent Title: Test system
- Patent Title (中): 测试系统
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Application No.: US14827743Application Date: 2015-08-17
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Publication No.: US09484116B1Publication Date: 2016-11-01
- Inventor: Masaaki Kosugi , Takashi Ohguro , Michisuke Sakamoto , Toshiro Fujii , Takahiro Honma , Hideto Omori
- Applicant: ADVANTEST CORPORATION
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Cantor Colburn LLP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G06F11/00 ; G11C29/38 ; G11C29/36 ; G01R31/319

Abstract:
At least one general-purpose server is connected to a PE module via Ethernet (trademark). A control unit of the PE module controls a PE circuit and multiple fail memory in a real-time manner, temporarily stores fail information stored in the multiple fail memory, performs data processing on the fail information, and transfers the fail information thus processed to the general-purpose server. Each general-purpose server is controlled according to a computer program so as to perform redundancy analysis for a DUT based on the data received from the PE module.
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