Invention Grant
- Patent Title: Multi-layered conductive metal oxide structures and methods for facilitating enhanced performance characteristics of two-terminal memory cells
- Patent Title (中): 多层导电金属氧化物结构和促进两端存储单元性能特性的方法
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Application No.: US14453982Application Date: 2014-08-07
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Publication No.: US09484533B2Publication Date: 2016-11-01
- Inventor: Jian Wu , Rene Meyer
- Applicant: Unity Semiconductor Corporation
- Applicant Address: US CA Sunnyvale
- Assignee: UNITY SEMICONDUCTOR CORPORATION
- Current Assignee: UNITY SEMICONDUCTOR CORPORATION
- Current Assignee Address: US CA Sunnyvale
- Agency: Lowenstein Sandler LLP
- Main IPC: H01L45/00
- IPC: H01L45/00 ; H01L27/24

Abstract:
A memory cell including a two-terminal re-writeable non-volatile memory element having at least two layers of conductive metal oxide (CMO), which, in turn, can include a first layer of CMO including mobile oxygen ions, and a second layer of CMO formed in contact with the first layer of CMO to cooperate with the first layer of CMO to form an ion obstruction barrier. The ion obstruction barrier is configured to inhibit transport or diffusion of a subset of mobile ion to enhance, among other things, memory effects and cycling endurance of memory cells. At least one layer of an insulating metal oxide that is an electrolyte to the mobile oxygen ions and configured as a tunnel barrier is formed in contact with the second layer of CMO.
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